Profilometry of thin films on rough substrates by Raman spectroscopy
Year:
2016
DOI:https://doi.org/10.1038/srep37859
Authors:
Martin Ledinský, Bertrand Paviet-Salomon, Aliaksei Vetushka, Jonas Geissbühler, Andrea Tomasi, Matthieu Despeisse, Stefaan De Wolf, Christophe Ballif, Antonín Fejfar
-
Solar cells
-
Surfaces
-
interfaces
-
thin films
-
Two-dimensional materials
