Long-term reliability remains a major barrier to the commercialization of perovskite photovoltaics, with potential induced degradation (PID) emerging as a critical system-level failure mode. Specifically, PID has been observed in thin-film perovskite solar cells under strong negative voltage and was attributed to sodium ions migrating from the glass substrate to the cell. Here, we report a PID study of encapsulated inverted (p-i-n) perovskite solar cells subjected to positive and negative voltage (±1000 V) for 168 h following the IEC aluminum-foil testing protocol. We find that devices under positive voltage retained more than 95% of the initial power output, meeting the qualification criterion typically applied to commercial modules. These results highlight that PID can be resolved at the system level, thereby relaxing constraints at both the cell and module levels.